Electrical Characterization

Solutions to access die electrical characterization

Different Electrical Characterizations

Electrical Characterization is the key means to characterize and validate your product quality, but from tester to nano-probing, usecases and technologies involved are different: from a simple oscilloscope/ probing through the padsdown to most advanced nano-probing solutions/ applications.

• Tester enables device engineer standard electrical characterization (through PADS)

  • Check for more information on testers solutions to support effectively debug on silicon. our solution enables designer to have an in-house silicon validation solution, being independent of outsourced tester capabilities.

  • Our tester is also perceived as a unique solution for failure engineers to enable advance fault localization combined with EFA technique (see our solutions)

• FIB enables accessing to any die location and building PAD. Hence, it is a designer troubleshooting solution, enabling creating access anywhere on the device, and still having a functional die (able to run test sequence)

  • Check our circuit edit solutions for FIB PADS information

• Timing Characterization enables designer to validate the different timing across the full DUT (device under test), and to characterize any time violation/ failing clock, etc…
  • Check our Design solution for advanced timing characterization information - or our Design Debug product

• Nano-probing allows probing at gate/transistor level  for best in-class electrical characterization .
  • Valuable for gate analysis for the process integration engineer
  • Valuable to validate fault localization prior to physical characterization – ensuring correlation between the electrical characterizations of a potential fault with expected simulation results.

Nano-Probing - flexibilities in applications

Sector Technologies offers multiple solutions for electrical analysis & more specifically, for Nano- Probing. Application range & electrical probing quality drive the technologies needs

There are multiple applications enabled by efficient nano-probing solution for both technology development and failure analysis needs.

Nano-probing – technical requirement for advance node – down to 10nm

Electrical characterization requirements for the most advanced node can be summarized as:

• Ensuring quality probing
  • with long enough probing time/ multiple landing
  • ensuring localization of the probing
  • without damaging signal nor device
• Enabling applications
  • Providing flexibility in probing position
  • Providing ease of use in applications / landing

Sector Technologies offers high end solutions to fit your nano-probing requirements

• Check how ThermoFisher NanoProbing innovative solution provides both best in class nano probing solution, proven for 10nm and a wide range of applications.