DocumentsDate added
ISTFA 2011
Thermal Frequency Imaging: A new application of Laser Voltage Imaging applied on 40nm technology
G. Celi, S. Dudit, T. Parrassin (ST Microelectronics), P. Perdu (CNES), A. Reverdy (Sector Technologies), Dean Lewis (IMS), M. Vallet (ST Microelectronics)
ESREF 2011
LVI detection on passive structure in advance CMOS technology: New opportunities for device analysis
G. Celi, S. Dudit, T. Parrassin (ST Microelectronics), P. Perdu (CNES), A. Reverdy (Sector Technologies), Dean Lewis (IMS), M. Vallet (ST Microelectronics)
ISTFA 2009
Overview of Laser Voltage Imaging (LVI) solution
(purchase online)
Deyine, A. Sanchez, K. Perdu, P. Bourcier, F. Battistella, F. Bereil, F. Le Nouy, P. Lewis, D. Deslandes, H. THALES, CNES (Centre Nat. d'Etudes Spatiales- French Space Agency) Lab., Toulouse, France
ISTFA 2009
ESREF 2010
"Facing the defect characterization and localization challenges of bridge defects on a submicronic technology (45nm and below)" (ST Microelectronics, Sector Technologies, CNES, IMS)