The MT5S is a full ATE machine designed to be used for the validation and characterization process.

With its very compact form factor , its very low power consumption the MT5S is air cooled and can be run within the Engineer’s office.

The MT5S can accommodate any of the MuTest instruments portfolio in any slot.

- 5 Slots electro-mechanical structure
- Air cooled systemt
- 5 Slots Pogo Frame
- Calibration & Diagnostics loadboard
- MTGTW Tester Interface: 1G Ethernet, +5, +15, - 15 Volts user power supply, utility bits
- < 600 Watts fully loaded

- 19 Slots electro-mechanical structure
- Air cooled system
- 19 Slots Pogo Frame
- Calibration & Diagnostics loadboard
- MTGTW Tester Interface: 1G Ethernet, +5, +15, - 15 Volts user power supply, utility bits
- < 3 kWatts fully loaded

Description Designed for SOC and Memory testing, the MTD864 supports many mode of operations and data distribution:
- Up to 1Gbit chain can be applied on any pin, allowing scan testing of complex devices,
- Source synchronous testing mode allows for accurate strobing of memory controllers or devices,
- Hardware Subroutine and APG allows for complex pattern generation,

Debug of your device is facilitated with the optional CBitmap module which implements either 32Mbit of capture memory or a true Bitmap providing you with the failing memory cells
The 1Gbps dual Driver Comparator Load interfaces with any single ended or differential technology. Fast and accurate parametric test and characterization are performed through the embedded PmuPP.

Its FPGA based technology insures you a ROI on multiple DUT generation as well as implementation of proprietary protocol or access.

Key Features

- 64 channels @ 800Mbps
- 4K Subroutine & APG Capability
- Scan Chain capability
- 1 Gb / 32MVector Memory per 32 channels
- 128 Mb Capture memory with 12.8 Gb/s bandwidth per 32 channels
- 2 additional free running clocks
- PMU per pin

The MTDPS10 is a set of 4 quadrants DUT Power Supplies which combines 10 DPS on a single instrument with a mix of High Current and Medium current ranges to accommodate the various needs of IC applications.

In addition the 8 Medium current range DPS can be ganged to supply more current if necessary.

The instrument still has a power consumption of < 70W.

Key Features

- 8 * 800mA channels
- 2 * 5 A Channels
- Measure current, clamp current

Designed for SOC, DDR1,2,3 and SRAM testing, it provides you with a full image of your failing memory cells. The data can then be computed for device repair or process analysis.

The module works in conjunction with the MTD864 module which provides 64 channels at 800Mbps. The memory test algorithm is calculated by the HW APG embedded inside the MTD864 controller. It is applied to the DUT through the channel controllers which return the individual Pin/Fdata status.

The X,Y,Z, data and PFail are then carried up to the Bitmap controller which performs Read/Modify/Write cycles at Full speed into the Bitmap memory.

Key Features

- 4 Gb Memory map, upgrade option @ 8 Gb
- Up to 64 bits wide databuses
- Full compatibility with digital instruments set
- < 100 Watts, air cooled

MTMixW performs MXSL test for embedded DAC/ADC or Audio/Video Features found in the SOC devices.

Its highly integrated features include 8 high performances channels and embedded DSP for parallel data analysis in a single low power instrument which could be used for characterization or high volume production. The “on-board” DSP per channel allows for very fast data computing and results contributing to the low cost of test.

Key Features

- 4 samplers with high accuracy or high frequency
- 4 AWG with high accuracy or high frequency
- 8 independent channels with individual time domain in a single slot for true parallel test
- Compatible with all electrical standards
- Synchronization with digital instruments or external trigger
- PMU