Near IR Lenses for Photo emission application
PE IR Plan APO series 2.5x/ 20/50X/100X
PE IR APO lenses focus on a specific range of 800nm - 1600nm with long working distance with high resolution. PE IR Plan APO is precisely color-corrected with 0 focal shift between these two wavelengths.
Available in a 2.5X, 20X, 50X and 100X maginifications to suit all your needs.
Full catalogue available : please contact us.
Note: LCD and Silicon Corrected lens also available.
Some Specifications
| Model# |
PE IR PlanAPO 2.5X
|
PE IR PlanAPO 20X
|
PE IR PlanAPO 50X
|
PE IR Plan APO 100X
|
| Magnification |
2.5X
|
20X
|
50X
|
100x
|
| Working Distance |
30mm
|
12mm
|
10mm
|
10mm
|
| Focal length |
80mm
|
10mm
|
4mm
|
2.0mm
|
| N.A |
0.1
|
0.5
|
0.6
|
0.75
|
| Resolution |
3.3μm
|
0.6μm
|
0.5μm
|
|
| Depth of focus |
27.5μm
|
1.1μm
|
0.7μm
|
|
| Wave length |
800-1600nm
|
900nm - 1500nm
|
||
| Transmission |
80%<（400-1800nm）
|
70%<（540nm)
70%<（1300nm） |
70%<（540nm)
70%<（1300nm） |
80%< (1,000nm -1,500nm)
|
| Glass correction |
-
|
-/1.0mm（LCD）
|
-/1.0mm（LCD）
|
|
| Weight |
300g
|
424g
|
493g
|
|
microscope
Seiwa IR-2200 : NIR/ SWIR
Seiwa IR-2200 system integrates an infrared table-top microscope with a high quality optics, powerful software and 4.1 Megapixel USB-3.0 NIR InGaAs or CMOS camera.
Seiwa IR-2200 system is capable of:
- high precision measurements
- image capture and videos
- verification and inspection of materials transparent to the near infrared (NIR) / Shortwave Infrared (SWIR) wavelengths.
Seiwa IR-2200 enables FA / Q&R engineers to inspect sub-surface images including:
- 3D stacks
- MEMS devices
- incoming wafers
- photovoltaic
- wafer level Chip Scale Packages
A wide choice of high quality SEIWA objectives is available upon customer’s need.
These products are SEIWA Optical's solutions 
