Fault Localization

MultiSolutions with the highest sensitivity & resolution

Fault isolation solutions are required after electrical test to identify where is physical defect locate.

All electrical failure analysis solution

FEI  suite of solutions can adapt to all your Electrical Failure Analysis needs. Providing most advanced analysis solution on silicon, extending solution on wafers if required, as well as, enabling packaging analysis.

	This suite can be completed with:

Application for Electrical Failure Analysis - Fault Localization on Silicon

Applications for Electrical Failure Analysis - Fault Localization on Package