Top Solutions
Testers & EDA tools
Tester for Designers
- Speed up your
- Enable new Failure Analysis support
Tester for Performances
- Best Performance for Digital (incl DDR2/DDR3), MixWave Testing
Localize Fault in Package
Localize Hot Spot
- For package/ power devices/ silicon and more applications
New! Localize Opens
- 5µm resolution thanks to TeraHertz system
Inspect
- Infrared Superficial Inspection: Seiwa IR-2200 microscope
EFA (Silicon)
Providing ALL localization solutions for EFA (Electrical Failure Analysis)
- Wide range of techniques (EMMI, SLS, DLS, …) for FA lab with Best Performances
- Don't Get stuck with Broken Scan Chain - Let's LVx it
IC decapsulation
Acid and Laser Decapsulation- Get ready and working solution for your copper/silver/complex alloy packages.
- Unique and Patented Electrolysis process for copper protection
- Reliable laser ablation solution with Decap 10 and Decap 20 products
Latest news
- Happy New Year 2019
- Elite Users Group - April 9th 2019 Halle Germany
- CAM-Workshop - April 10th/11th, 2018 Halle Germany
- Sector Technologies is now representing Semics and Ippon
- FEI is now ThermoFisher Scientific
