Tese
da testers for silicon validation
Tester solutions focused for designer, product engineers and failure analysis engineers
Teseda hardware plateform V550 or V520, in conjunction with Teseda’s TWB and diagnostic manager softwares NetXY, enables:
- design or product engineer to quickly validate initial silicon, thereby saving weeks in the silicon verification process. It is focused to complete the scan chain debug, getting debug independent of outsourcing testing capabilities.
- failure analysis engineer to support dynamics applications on their Electrical Failure Analysis applications – taking advantage of the portable, easy to use system to quickly diagnose issues as a stand alone system or in conjunction with leading FA equipment.
Hardware - V550/ V520
Teseda hardware plateform is an portable, easy to use tester system focused in enabling high failure coverage. Unlike production ATE, it has much more memory for failure capture. Its high failure coverage thus enabler designer scan chain debugging on silicon. It can be used as well of stimulus for the failure analysis equipements.
Check for V520 tester solution - Large Capacity, small footprint. The V520 may be the smallest tester on the market, but it comes with enough capacity to tackle many validation and FA jobs. It supports 348 pins with 32M Vectors of force and expect data and 20M vectors of capture data. And it fits in your briefcase.
Check for V550 tester solution - The V550 supports 512 pins configurable as either data or clock. It is available in an 80 MHZ scan rate version, and is upgradeable to 100 MHZ. The memory subsystem includes 32 Million Vector Drive/compare per channel (upgradeable to 64 Million), 40 Million Vector capture memory per channel and 16 Million Vector failure capture per channel.
Software - Teseda WorkBench
The Teseda WorkBench™ (TWB) software exploits the full power of your DFT investment, enabling design, test, manufacturing and FA teams to work together to reduce time to production, accelerate yield learning, and maximize profits.
The TWB operates interactively on the Teseda V5xx series desktop hardware or on your in-house ATE to provide fast, explicit, diagnostic information based on the design and DFT hierarchical information. No more deciphering pin and cycle failure information.
Turn days of debug time into hours.
Software – NetXY & Diagnostic ManagerTM series
NetXY™ is the newest product in Teseda’s Diagnostic Manager™ series.
NETXY™ quickly links structural test mismatch data to its physical domain for rapid analysis and diagnosis of defects and hot spots.
It bridges design, test, manufacturing and failure analysis by providing the logical to physical correlation using the benefit of your scan architecture.
Features includes the following:
- Net and subnet viewing capability
- Gate delay paths between scan cells
- Scan cell stitching highlighted by subnet
- Defect candidate subnet (where feasible)
- Metal layers
- Diagnose net trends based on scan and defect gate candidates
V520, V550, TWB and NetXY are Teseda's solutions