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- Opening - Sample Prep
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- Elect. Failure Analysis
- Elect. Characterization
  - NanoProbing
- Design Debug solutions
- Circuit Edit
- Design and product eng.
- Tester for design debug
- Design Debug - timing validation
- Circuit Edit
- Laboratory solutions
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  - Package opening
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  - Metrology
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- Specific Applications
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Products
- Testers
- Teseda Testers
  - Tester HW & SW
  - Diag Mgr
  - Broken Chain Analyser
  - Field Triage
- MuTest Testers
  - MuTest Structures
  - ATE Digital test instrument
  - ATE power supply
  - ATE Bitmap
  - ATE_Mixed_Signal_MTMIXW
- PCB- Pack. Fail. Analysis
- Pack Fault Localizat
  - Teraview EOTPR
  - ELITE
- X-Ray 2D
- X-Ray 3D
  - MicroXCT-200
  - VersaXRM-410
  - VersaXRM-500
  - UltraXRM-L200
- Silicon Failure Analysis
- Fault localization
  - Meridian IV
  - Elite
  - Waferscan
  - Trivision
  - LVx Option
  - CAD interface - NEXS
- NanoProbing
  - nProber
  - dProber
  - sProber
- Circuit Edit - FIB
  - OPTIFIB IV
  - P3X IV
- Design Debug
  - Emiscope
  - RUBY
  - LVx option
- Sample Prep
- Package opening
  - JetEtch
  - PM-Laser
- Delayering
  - GelEtch
- Metrology
  - VarioMetric
  - VarioProfile
- Silicon Access
- More
- Optics & Imaging
  - IR lenses for EMMI
- Counterfeit Detection
  - Truview
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