Mems


MEMS characterization


Solution to see “THROUGH” the MEMS

 

 

 

Similarly that MEMS quality & reliability can not be considered simply like IC, since there are mechanical & new processed (packaging/ cavities), analysis is critical to adapt to such specificities.

Cavities protect MEMS Mechanism

Compare to standard semiconductor processes, there are specific MEMS challenges, mainly related to sensitive packaging & “cavities”.

Example of MEMS encapsulation & package | Example of MEMS mechanical part

 

Control techniques need to see “THROUGH”

Why is it important?

open-mems MEMS failure mechanism are hidden either by cavity or package. Inline control are limited to 'visible' fault.

  • (1) MEMS can fail, (2) package can cause failure, or (3) package can cause unstable functionality/ reliability … A close cavity or package is not always ensuring protection of mechanical part, so you need to see through it
  • MEMS packaging also include connection to the controler component. According to ISTFA 2009, MEMS packaging accounts for 85% of fabrication cost

Sector Technologies offer multiple solutions to support your analysis requirements

  • Measurement for your encapsulated MEMS, see through Si and Glass, get easy and fast thickness or profile of the cavity/ MEMS.
    • For examples of our solution – check our usecase – showing how tilt between MEMS and cavities can be assessed
  • Ensuring NDT visualization of your MEMS, Full 3D non destructive solution, high resolution solution for large sample
    • For more information – check our usecase - getting beyond 2D limits, and ensuring high-resolution 3D view
    • Check why MEMS’s required best in class 3D Xray CT tomography, don’t just expect an other extension of a  Xray 2D plateform… more information on unique Xradia solutions.
  • Identifying electrical failure localization, leakage, and thermal characterization
    • For more information on our electrical fault isolation solution - check ELITE solution for through package fault isolation and thermal characterization


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