High Resolution and Contrast; Large Sample Size Range
The MicroXCT-400 encompasses all the benefits of the MicroXCT-200 in addition to having a larger enclosure, longer stage travel, additional baffle inputs, and a heavy load sample stage.
Its unique design allows for high resolution imaging for relatively large samples. Its detectors are tailored to image both high and low absorption materials.
- Semiconductor Package FA
- through-silicon vias
- Non-destructive 3D X-ray imaging
- High spatial resolution down to 0.7 µm
MicroXcT-400 is a Xradia solution
