
High Resolution and Contrast; Large Sample Size
The MicroXCT-200 is a versatile 3D X-ray imaging system suited for non-destructive analysis of a large variety of samples.
Its unique design allows for high resolution imaging for relatively large samples. Its detectors are tailored to image both high and low absorption materials.
- Semiconductor Package FA
- through-silicon vias
- Non-destructive 3D X-ray imaging
- High spatial resolution down to 0.7 µm
MicroXcT-200 is a Xradia solution