News & Events
News/ Press releases
- Press release: Sector Technologies has completed an exclusive distribution agreement with Nisene Technology Group to sell and provide maintenance support for all products in Europe
- Sector Technologies is now representing Teseda products. Teseda is a leader on Scan Chain debug tools, more information on www.teseda.com.
- Press release: CIMPACA Characterization lab selects DCGSystems Waferscan, LVx and ELITE Technologies.
- Award: EuroAsia 2010 Fab Management Award for Circuit Edit service for sub-100nm IC technology designs granted to "MASER engineering" (service lab offering OptiFIB-IV solution) - " The new OptiFIB-IV system has led to MASER receiving the FAB Management Award in the IC Industry Awards." - see publication
Coming and recent events with Sector Technologies
- Extended EUFANET workshop 2011: November 28th to 29th 2011 - www.eufanet.org/ - Toulouse (France)
- ISTFA 2011: November 13 to 17th 2011 - www.asminternational.org/content/Events/istfa/ - San Jose (CA, USA)
- Paper accepted from Sector Technologies & partners
- ESREF 2011: October 3rd to 7th 2011 - esref2011.ims-bordeaux.fr - Bordeaux (France)
- 22nd European Symposium on Reliability of Electron Devices, Failure Physics and Analysis
- We will welcome you in our booth #1
- Sector Technologies Seminar to be held
- Active participation of Sector Technologies during EUFANET Workshop
- THERMINIC 2011: September 27th -29th 2011 - cmp.imag.fr/conferences/therminic/therminic2011/ - Paris (France)
- Paper accepted on "Enhanced Package- and Die-Level Defect Localization by Dynamic Lock-InThermography"
- MINAPAD 2011 - May 11th -12th - www.imapsfrance.org/minipad/- Grenoble (France)
- S4D 2011 - March 14th - www.ecsi.org/s4d2011/workshop - Grenoble (France)
- Publication on ELITE's solution for Scan Chain Debug
- ESREF 2010: October 11th to 15th 2010 - www.esref2010.unicas.it - Gaeta (Italy)
- 21st European Symposium on Reliability of Electron Devices, Failure Physics and Analysis
- See publications - EFA folder
- Sector Technologies Seminar held on Thursday 14th
- Active participation of Sector Technologies during EUFANET Workshop
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ANADEF 2010: June 1st to 4th - www.anadef.org
- PAca Security Trends In embedded Security 2010 - Gardanne (France-13), 16 and 17 June 2010
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ISTFA 2010 - see news from partners
Overall Events/ Networks
We participate to numerous shows, events, as well networks, in Europe and in the world
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Atelier ANADEF - www.anadef.org
- ANADEF 2010: June 1st to 4th - www.anadef.org
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European FIB Users Group (EFUG) - www.imec.be/efug
- EFUG workshop - Monday Nov11th - hold during ESREF conference
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European Symposium on Reliability of Electron devices and Failure analysis (ESREF)
- ESREF 2010: October 11th to 15th 2010 - www.esref2010.unicas.it - Gaeta (Italy)
- ESREF 2011: October 3rd to 7th 2011 - esref2011.ims-bordeaux.fr - Bordeaux (France)
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International Symposium for Testing and Failure Analysis (ISTFA)
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Informations Technische Gesellshaft (ITG)
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EUropean Failure Analysis NETwork (EUFANET)– www.eufanet.org – (board member)
- Active participation of Sector-Technologies during EUFANET workshop - Wednesday Nov13th - hold during ESREF conference
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International Microelectronics and Packaging Society (IMAPS)
News from Partners
- DCG Systems's News
- DCG Systems Expands Product Offerings in Thermal Testing through Acquisition of Thermosensorik GmbH
- More specifically
- ISTFA 2011- Date: November 15-16, 2011 - Location: Santa Clara, CA
- multiple papers accepted
- ISTFA 2011- Date: November 15-16, 2011 - Location: Santa Clara, CA
- See DCG's News page
- See DCG's Technical Publication Pages
- XRadia's News
- 2011 March 29th Xradia launched is new product - VersaXRM 500
- More specifically
- IPFA 2011 - Date: July 4-7th - Location: Songdo Convensia, Incheon, Korea
- Paper presented "Application of X-Ray MicroCT for Non-Destructive Failure Analysis and Package Construction Characterization"
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ISTFA 2011- Date: November 15-16, 2011 - Location: Santa Clara, CA - Booth: 423
- IMAPS 2011 - Date: October 10-14, 2011 - Location: Long Beach, CA - Booth 110
- See more update on Xradia's News page
- Creative Electron
- Press Release on distribution referencing Creative Electron as solution for Counterfeit Detection PCX Inc. Acquires The TruView Xray Inspection System Designed By Creative Electron, Inc
- For more information on Counterfeit Detection network - check ERAI & their reports
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Varioscale's News
- ISTFA - November 6-8, 2007 - San Jose, CA, USA -Booth #526
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Seiwa Optical's News
- PHOTONIC WEST 2009 - BOOTH#: 6193 South Hall 1
New Products introduction
- Xradia launches the VersaXRM familly of X-ray Microscope (March 29, 2011)
- Xradia Introduces UltraXRM Microscope: Ground-breaking 3D X-Ray Imaging for Laboratories (August 16, 2010)
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DCG Systems Expands Product Offerings through Acquisition of Zyvex Instruments (February 11, 2010)
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DCG Systems Technical Update - November 2009 (PDF 608 KB)
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DCG Systems Technical Update - August 2009 (PDF 1.39 MB)
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Advanced FIB Chemistry
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Patented precision navigation with electronic beam deflection
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An Interview with Stephen Wallace of SanDisk Corporation
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DCG Systems Introduces new Diagnostic Tools for Wafer Yield Improvement, Lock-in Thermography and Laser Voltage Imaging (November 10, 2009)
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DCG Systems Introduces Significant Upgrades to Its Yield Improvement, Fault Localization and Design Debug Products (November 3, 2008)
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DCG Systems, Inc. Announces Distribution Agreement With SECTOR Technologies (May 6, 2008)
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Xradia Announces New X-ray Solutions for Advanced Semiconductor Packaging
Participation to National/ European Projects
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We do have active participation – either directly or indirectly to National/ European Projects. However, due to confidentiality, this information is not yet released.